Performance Analysis Of Mono-bit Digital Instantaneous Frequency Measurement (Difm) Device

Document Type : Research Article

Authors

1 Dept. of Elrctrical Engineering, Amirkabir University of Technology, Tehran, Iran

2 Dept. of Science and Research, Azad University, Tehran, Iran

3 Dept. of Elrctrical Engineering, Amirkabir University of Technology, Tehran,Iran

Abstract

Instantaneous Frequency Measurement (IFM) devices are the essential parts of any
ESM, ELINT, and RWR receiver. Analog IFMs have been used for several decades. However, these
devices are bulky, complex and expensive. Nowadays, there is a great interest in developing a wide
band, high dynamic range, and accurate Digital IFMs. One Digital IFM that has suitably reached all
these requirements is mono-bit zero-crossing IFM, made by some different producers at present. In
this paper, the performance of mono-bit digital Instantaneous Frequency Measurement (IFM) device
is analyzed. This analysis includes quantization error, thermal noise, clock jitter, comparator bias and
also “Pulse-on-Pulse” occurrence. The error limits due to all these factors are computed and analyzed,
and a unified approach to the system design is presented
In this paper, the performance of mono-bit digital Instantaneous frequency measurement (IFM) device is analyzed. This analysis includes quantization error, additive (thermal) noise, clock jitter, comparator bias and also “Pulse-on-Pulse” occurrence. The error limits due to all these factors are computed and analyzed, and a unified approach to the system design is presented

Keywords

Main Subjects

References

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AUT Journal of Electrical Engineering
Volume 49, Issue 2
December 2017
Pages 131-140

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