[1] T. Hirayama, The evolution of CMOS Image Sensors, 2013 IEEE Asian Solid-State Circuits Conference (A-SSCC), 2013, pp. 5-8, doi: 10.1109/ASSCC.2013.6690968.
[2] J. Nakamura, Image sensors and signal processing for Digital Still Cameras, Boca Raton: CRC Press. 2006.
[3] D. Durini,High Performance Silicon Imaging,Fundamentals and Applications of CMOS and CCD Sensors,A volume in Woodhead Publishing Series in Electronic and Optical Materials,Elsevier, 2020.
[4] D.Durini, D.Arutinov, Fundamental principles of photosensing, Fundamentals and Applications of CMOS and CCD Sensors,In Woodhead Publishing Series in Electronic and Optical Materials, High Performance Silicon Imaging (Second Edition), 2020, doi:10.1016/B978-0-08-102434-8.00001-5.
[5] P. Feng, L. Liu and N. Wu, Pixel Design of Ultra-high Speed CMOS Image Sensor, IEEE 14th International Conference on ASIC (ASICON), 2021, pp. 1-4, doi: 10.1109/ASICON52560.2021.9620252.
[6] J. Xu, L. Shu, Z. Gao, Q. Chen and K. Nie, Analysis and Parameter Optimization of High Dynamic Range Pixels for Split Photodiode in CMOS Image Sensors, in IEEE Sensors Journal, vol. 22, no. 7, pp. 6748-6754, 1 April1, 2022, doi: 10.1109/JSEN.2022.3155482.
[7] K. -L. Chung, T. -Y. Liu and J. -S. Cheng, Novel and Optimal Luma Modification-Based Chroma Downsampling for Bayer Color Filter Array Images, in IEEE Open Journal of Circuits and Systems, vol. 1, pp. 48-59, 2020, doi: 10.1109/OJCAS.2020.2996624.
[8] Eric R. Fossum; Donald B. Hondongwa, A Review of the Pinned Photodiode for CCD and CMOS Image Sensors, IEEE Journal of the Electron Devices Society, Year, Vol. 2, 2014.
[9] M.teymouri, A highly linear and high-accurate CMOS image sensor, Analog Integr Circ Sig Process 102, 91–96, 2020, https://doi.org/10.1007/s10470-019-01553-4
[10] B. Razavi, Design of Analog CMOS Integrated Circuits, New York, NY: McGraw‐Hill, 2001.
[11] F. Wang and A. J. P. Theuwissen, Pixel Optimizations and Digital Calibration Methods of a CMOS Image Sensor Targeting High Linearity, in IEEE Transactions on Circuits and Systems I: Regular Papers, vol. 66, no. 3, pp. 930-940, March 2019, doi: 10.1109/TCSI.2018.2872627.
[12] F. Wang, L. Han and A. J. P. Theuwissen, Development and Evaluation of a Highly Linear CMOS Image Sensor With a Digitally Assisted Linearity Calibration, in IEEE Journal of Solid-State Circuits, vol. 53, no. 10, pp. 2970-2981, Oct. 2018, doi: 10.1109/JSSC.2018.2856252.
[13] F. Wang F,AJP. Theuwissen, Techniques for pixel-level linearity optimization, in Proc. Workshop CMOS Image Sensors High Perform. Appl. Paris, France. 2017: 1–20.
[14] G. Batistell, V.C. Zhang, J. Sturm, Color recognition sensor in standard CMOS technology, Solid. Electron. 102, 2014.
[15] H. Alaibakhsh and M. A. Karami, A shared transfer gate 2T pixel, 2017 IEEE 4th International Conference on Knowledge-Based Engineering and Innovation (KBEI), 2017, pp. 0522-0525, doi: 10.1109/KBEI.2017.8325033.
[16] M. Mori, M. Katsuno, S. Kasuga, T. Murata and T. Yamaguchi, 1/4-inch 2-mpixel MOS image sensor with 1.75 transistors/pixel, in IEEE Journal of Solid-State Circuits, vol. 39, no. 12, pp. 2426-2430, Dec. 2004, doi: 10.1109/JSSC.2004.837028.
[17] M. Kasano, Y. Inaba, M. Mori, S. Kasuga, T. Murata and T. Yamaguchi, A 2.0-/spl mu/m pixel pitch MOS image sensor with 1.5 transistor/pixel and an amorphous Si color filter, in IEEE Transactions on Electron Devices, vol. 53, no. 4, pp. 611-617, April 2006, doi: 10.1109/TED.2006.870286.
[18] C. Yin, T. Liao, K. -L. Liu, C. -C. Kao, C. -F. Chiu and C. -C. Hsieh, A 32-Stage 15-b Digital Time-Delay Integration Linear CMOS Image Sensor With Data Prediction Switching Technique, in IEEE Transactions on Electron Devices, vol. 64, no. 3, pp. 1167-1173, March 2017, doi: 10.1109/TED.2017.2655143.
[19] Y. Jo, S. Hong and O. Kwon, A Tileable CMOS X-Ray Line Detector Using Time-Delay-Integration With Pseudomultisampling for Large-Sized Dental X-Ray Imaging Systems, in IEEE Transactions on Electron Devices, vol. 64, no. 1, pp. 211-216, Jan. 2017, doi: 10.1109/TED.2016.2632131.
[20] J. Xu, X. Shi, K. Nie and Z. Gao, A Global Shutter High Speed TDI CMOS Image Sensor With Pipelined Charge Transfer Pixel, in IEEE Sensors Journal, vol. 18, no. 7, pp. 2729-2736, 1 April1, 2018, doi: 10.1109/JSEN.2018.2800743.