Amirkabir University of Technology AUT Journal of Electrical Engineering 2588-2910 49 2 2017 12 01 Performance Analysis Of Mono-bit Digital Instantaneous Frequency Measurement (Difm) Device 131 140 1985 10.22060/eej.2017.12155.5050 EN Y. Norouzi Dept. of Elrctrical Engineering, Amirkabir University of Technology, Tehran, Iran H. Shahbazi Dept. of Science and Research, Azad University, Tehran, Iran S. Mirzaei Dept. of Elrctrical Engineering, Amirkabir University of Technology, Tehran,Iran Journal Article 2016 11 12 Instantaneous Frequency Measurement (IFM) devices are the essential parts of any<br />ESM, ELINT, and RWR receiver. Analog IFMs have been used for several decades. However, these<br />devices are bulky, complex and expensive. Nowadays, there is a great interest in developing a wide<br />band, high dynamic range, and accurate Digital IFMs. One Digital IFM that has suitably reached all<br />these requirements is mono-bit zero-crossing IFM, made by some different producers at present. In<br />this paper, the performance of mono-bit digital Instantaneous Frequency Measurement (IFM) device<br />is analyzed. This analysis includes quantization error, thermal noise, clock jitter, comparator bias and<br />also “Pulse-on-Pulse” occurrence. The error limits due to all these factors are computed and analyzed,<br />and a unified approach to the system design is presented<br />In this paper, the performance of mono-bit digital Instantaneous frequency measurement (IFM) device is analyzed. This analysis includes quantization error, additive (thermal) noise, clock jitter, comparator bias and also “Pulse-on-Pulse” occurrence. The error limits due to all these factors are computed and analyzed, and a unified approach to the system design is presented https://eej.aut.ac.ir/article_1985_1f36c15d6a3d18d52e8d493bc8187cb9.pdf